防(fang)爆加(jia)(jia)(jia)(jia)熱(re)(re)(re)(re)管(guan)(guan)是(shi)一種消耗電(dian)能(neng)轉(zhuan)換為(wei)熱(re)(re)(re)(re)能(neng)，來對需加(jia)(jia)(jia)(jia)熱(re)(re)(re)(re)物料進行加(jia)(jia)(jia)(jia)熱(re)(re)(re)(re)。防(fang)爆加(jia)(jia)(jia)(jia)熱(re)(re)(re)(re)管(guan)(guan)是(shi)由(you)外到里外殼（不(bu)繡鋼(gang)/碳鋼(gang)/銅(tong)/鈦材等、發(fa)熱(re)(re)(re)(re)絲（鎳鉻鉛(qian)合(he)金）、填(tian)充物（氧化鎂，作用(yong)是(shi)導熱(re)(re)(re)(re)、絕緣）、外殼（不(bu)繡鋼(gang)、碳鋼(gang)、鈦材、銅(tong)  等）、陶瓷封(feng)頭（作用(yong)：絕緣）、防(fang)爆盒組(zu)成的。加(jia)(jia)(jia)(jia)熱(re)(re)(re)(re)管(guan)(guan)在(zai)工(gong)(gong)作中低溫流體介(jie)質通過管(guan)(guan)道在(zai)壓力(li)作用(yong)下進入(ru)其輸入(ru)口，沿著電(dian)加(jia)(jia)(jia)(jia)熱(re)(re)(re)(re)容器內部(bu)特(te)定換熱(re)(re)(re)(re)流道，運用(yong)空(kong)氣(qi)電(dian)熱(re)(re)(re)(re)管(guan)(guan)的流體熱(re)(re)(re)(re)力(li)學(xue)原理(li)設計的路徑，帶走空(kong)氣(qi)加(jia)(jia)(jia)(jia)熱(re)(re)(re)(re)管(guan)(guan)中的電(dian)熱(re)(re)(re)(re)元件(jian)工(gong)(gong)作中所(suo)產生的高溫熱(re)(re)(re)(re)能(neng)量，使空(kong)氣(qi)加(jia)(jia)(jia)(jia)熱(re)(re)(re)(re)管(guan)(guan)被加(jia)(jia)(jia)(jia)熱(re)(re)(re)(re)介(jie)質溫度升高，加(jia)(jia)(jia)(jia)熱(re)(re)(re)(re)管(guan)(guan)出(chu)口得到工(gong)(gong)藝(yi)要求的高溫介(jie)質。

產品特(te)點(dian)

1.升溫(wen)時間在(zai)試(shi)驗電壓下，元件從環(huan)境溫(wen)度升至試(shi)驗溫(wen)度時間應不(bu)大(da)于15min

2.額(e)(e)定功(gong)率偏差在充(chong)分發熱的條件(jian)(jian)下，元件(jian)(jian)的額(e)(e)定功(gong)率的偏差應不(bu)超過(guo)下列規定的范圍;對額(e)(e)定功(gong)率小于(yu)等于(yu)100W的元件(jian)(jian)為:士10%。對額(e)(e)定功(gong)率大(da)于(yu)100W的元件(jian)(jian)為+5%~- 10%或10W,取兩(liang)者中的較大(da)值。

3.泄露(lu)電(dian)(dian)(dian)(dian)流(liu)冷態(tai)泄露(lu)電(dian)(dian)(dian)(dian)流(liu)以及水壓和密封試(shi)驗(yan)(yan)后泄露(lu)電(dian)(dian)(dian)(dian)流(liu)應不超(chao)過0.5mA工作溫(wen)度下的(de)熱態(tai)泄露(lu)電(dian)(dian)(dian)(dian)流(liu)應不超(chao)過公(gong)式中(zhong)的(de)計算值，但不超(chao)過5mA I=1/6 (tTX0.00001) I一 熱態(tai)泄露(lu)電(dian)(dian)(dian)(dian)流(liu)mA t-發熱長度mm T-工作溫(wen)度C多個元件(jian)串聯到電(dian)(dian)(dian)(dian)源(yuan)中(zhong)時，應以這一組(zu)元件(jian)為(wei) 整(zheng)體進行泄露(lu)電(dian)(dian)(dian)(dian)流(liu)試(shi)驗(yan)(yan)。

4. 絕(jue)(jue)緣電阻(zu)出廠檢驗時(shi)冷態(tai)絕(jue)(jue)緣電阻(zu)應(ying)不小于(yu)50MQ密封試驗后(hou)，長期存放或(huo)者使用后(hou)的(de)(de)絕(jue)(jue)緣電阻(zu)應(ying)不消與MQ工作(zuo)溫度(du)下的(de)(de)熱(re)態(tai)絕(jue)(jue)緣電阻(zu)應(ying)不低于(yu)公式中的(de)(de)計(ji)算值，但(dan)應(ying)不小于(yu)1MQ R=「(10-0.015T) /t」X0.001 R熱(re)態(tai)絕(jue)(jue)緣電阻(zu)MQ t一-發(fa) 熱(re)長度(du)mmT一工作(zuo)溫度(du)°C

5.絕緣耐(nai)壓(ya)強(qiang)度元(yuan)件應在規定的試驗條件和試驗電壓(ya)下保持1min,而無閃(shan)絡(luo)和擊穿現象

6.經(jing)(jing)受通斷(duan)電的能力元件應能在規定(ding)的試驗條(tiao)件下(xia)經(jing)(jing)歷2000次通斷(duan)電試驗，而不發生損壞